LVEM 25 E

All-in-one EM with TEM, SEM, STEM, EDS, and ED modes. Compact, portable, and high-contrast imaging at low voltage

• Status: Active
• Country: Czechia
• Analyte Type / Target Of Analysis: Morphology and microstructure
• Vibration / Magnetic / Noise Tolerance
  : Not required; automated recovery from vacuum loss
• Electron Gun Type
  : Schottky FEG
• Standard Detectors [EM]
  : TEM: sCMOS; SEM: BSE; STEM: STEM detector; ED; EDS: SDD
• STEM
  : Yes
• STEM Parameters: STEM 10/15 kV modes; up to 940,000×; 1.0–1.3 nm resolution; FOV up to 105 μm
• Additional Analytical Capabilities
  : EDS (SDD 30 mm²), ED, element maps overlay with SEM/STEM
• Electron Optics
  : Electrostatic projective lens; magnetostatic objective lens; permanent magnet lenses
• Resolution [EM]
  : TEM: 1.0 nm; SEM: 4 nm; STEM: 1.0–1.3 nm
• Optical Column
  : Electrostatic and magnetostatic lens system
• Electron Beam Resolution
  : 1.0–4.0 nm depending on mode
• Image Parameters
  : Up to 1,300,000× magnification; digitalization 16-bit; FOV up to 225 µm; 2048×2048 pixels
• Magnification
  : TEM: 3,400 – 1,300,000×; STEM: up to 940,000×; SEM: up to 750,000×
• Chamber
  : Ultra-high vacuum with airlock; no cooling or vibration isolation required
• Camera Details
  : TEM: sCMOS, 2048×2048 px, 16-bit; STEM/SEM: 2048×2048 px
• Stage Parameters
  : X, Y: ±1 mm; Z: ±0.5 mm; tilt: ±20°
• Holder Types: Standard Ø 3.05 mm TEM grids
• Sample Size: 3.05 mm TEM grids
• Cooling System
  : Not required (permanent magnet lenses)
• Vacuum System
  : Diaphragm + turbo pumps (10⁻⁵ mbar); object: 10⁻⁸ mbar; gun: 10⁻⁹ mbar
• Power Specifications: 100–240 V / 50–60 Hz; max 600 VA
• Environmental Specifications: No special requirements (standard outlet; portable)
• Physical Specifications: Microscope: 780×740×1450 mm, 220 kg; Pump: 300×160×200 mm, 3 kg; Table: 1400×700×760 mm, 50 kg