Time-of-Flight Mass Spectrometry (TOF-MS) with pulsed glow discharge plasma ionization. Direct analysis of solid-phase materials with elemental, isotopic and depth profiling.
Specifications
- Category: Inorganic and Isotopic Mass Spectrometry
- Technique: GD-MS
- Manufacturer: Lumex
- Country: Russian Federation
- Available: Active
Specifications
Time-of-Flight Mass Spectrometry (TOF-MS) with pulsed glow discharge plasma ionization. Direct analysis of solid-phase materials with elemental, isotopic and depth profiling.
- Status: Active
- Country: Russian Federation
- Isotopic: Yes
- Elemental: Yes
- Analyte Type / Target Of Analysis: Most of elements, isotopes, and molecular species
- Measurable Isotopes/Elements: Major, minor, and trace elements
- Analyzer Type: Time-of-Flight MS
- Ion Source Type: Pulsed glow discharge plasma
- Inlet Types: Direct solid sample ablation or sputtering
- High Resolution: Yes
- Mass Resolution/ Mass Resolving Power: Up to 6000 (m/Δm at FWHM); nominal 4000
- Sensitivity: 1–100 ppb
- Detection Limits: 1–100 ppb
- Discharge Parameters: Pulsed glow discharge; Ar < 1 L/h
- Geometry Type: TOF with reflectron
- Focusing Type: Gridless ion mirror (reflectron focusing)
- Vacuum System: One forepump and two turbo molecular pumps
- Gas Supply: Argon < 1 L/h
- Physical Specifications: 1450 × 800 × 1550 mm
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