AFM-in-SEM for in-situ correlative microscopy. Enables simultaneous SEM and AFM measurements. Offers multimodal analysis including mechanical, electrical, and magnetic properties.
Specifications
- Category: Microscopy and Imaging
- Technique: SEM
- Manufacturer: NenoVision
- Country: Czechia
- Available: Active
Specifications
AFM-in-SEM for in-situ correlative microscopy. Enables simultaneous SEM and AFM measurements. Offers multimodal analysis including mechanical, electrical, and magnetic properties.
- Status: Active
- Country: Czechia
- Analyte Type / Target Of Analysis: Morphology and microstructure
- Additional Analytical Capabilities: CPEM, C-AFM, KPFM, MFM, EFM, STM, Nanoindentation
- Resolution [EM]: XYZ up to 0.2 nm × 0.2 nm × 0.04 nm
- Image Parameters: 2D imaging, 3D topography, correlated AFM/SEM imaging
- Magnification: Superb SEM magnification (via nanoindentation module)
- Chamber: SEM chamber compatibility listed
- Camera Details: Digital camera with NenoCase for navigation
- Sample Size: Max scanned area: 21 mm × 11 mm × 8 mm; weight: 100 g
- Vacuum System: 10⁵ Pa to 10⁻⁵ Pa
- Environmental Specifications: +10 °C to +35 °C
- Physical Specifications: 118 mm × 84 mm × 35.7–48.4 mm; 460 g
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