KLEORA

High-throughput Secondary Ion Mass Spectrometer (SIMS) for geochronology. Provides benchmark precision for U-Pb and U-Th isotopic analyses. Combines high spatial resolution and mass resolving power in a compact design.

• Status: Active
• Country: France
• Isotopic: Yes
• Elemental: Yes
• Analyte Type / Target Of Analysis: Most of elements, isotopes, and molecular species
• Measurable Isotopes/Elements: U, Th, Pb isotopes
• Analyzer Type
  : Magnetic Sector MS
• Ion Source Type: RF plasma oxygen ion source (O2−)
• Inlet Types: Automated sample storage with motorized adjustment
• High Resolution
  : Yes
• Mass Resolution/ Mass Resolving Power
  : Up to 20,000 (10% peak valley definition)
• Sensitivity
  : Enhanced with oxygen flooding, up to 7x improvement for Pb isotopes
• Detection Limits
  : Sub-ppm for trace elements
• Precision
  : <0.3%for U-Pb age dating in zircon standards
• Detector Type
  : Faraday Cup and Electron multiplier
• Primary Beam [SIMS]
  : Oxygen (O2−)
• Spatial Resolution
  : Sub-micron lateral resolution (<10 μm)
• Camera
  : High-resolution UV-light microscope for sample visualization
• Geometry Type
  : Double-focusing large geometry
• Focusing Type
  : Magnetic and electrostatic focusing
• Vacuum System
  : Ultra-high vacuum system
• Gas Supply: High-purity oxygen for ion source and flooding