JEM-ARM300F2 GRAND ARM2

Upgraded GRAND ARM system. Ultrahigh spatial resolution with sensitive X-ray analysis. Wide voltage range with enhanced FHP2/WGP polepieces.

• Status: Active
• Country: Japan
• Analyte Type / Target Of Analysis: Morphology and microstructure
• Vibration / Magnetic / Noise Tolerance
  : Stray magnetic field DC ≤0.05 µT, AC ≤0.05 µT, environmental enclosure standard
• Electron Gun Type
  : Cold FEG
• Optional Detectors [EM]: EDS with 2 detectors of 158 mm² SDD each
• STEM
  : Yes
• STEM Parameters: FHP2/WGP polepieces, high resolution and sensitivity STEM probe
• Additional Analytical Capabilities
  : EDS, EELS, atomic resolution mapping of 2D materials
• Electron Optics
  : Cs correctors (JEOL COSMOTM), FHP2/WGP polepieces, ETA Corrector
• Resolution [EM]
  : STEM: 53 pm (FHP2) / 59 pm (WGP) at 300 kV; TEM lattice: 50 pm (FHP2) / 60 pm (WGP); Info limit: 60–100 pm
• Optical Column
  : FHP2 or WGP polepiece with correctors
• Electron Beam Resolution
  : STEM: 53 pm / 59 pm
• Image Parameters
  : HAADF and ABF STEM, EDS mapping
• Camera Details
  : Ronchigram camera for aberration correction
• Stage Parameters
  : Tilt ±30°/±27° with standard holder, ±90° with high-tilt holder
• Holder Types: JEOL tilting holder, high-tilt holder
• Aberration Correction Type
  : ETA Corrector, JEOL COSMOTM corrector module
• Cooling System
  : Cooling water 15–20 ℃, flow 9.6–15.6 L/min depending on configuration
• Environmental Specifications: Room temperature 15–25 ℃, humidity ≤60%, air flow ≤100 mm/s, acoustic noise ≤60 dB
• Physical Specifications: Microscope room 7000×5500 mm, height 4100 mm