Atomic resolution analytical microscope with double Wien-filter monochromator. Achieves ultra-high energy resolution for EELS. Enables monochromatic STEM imaging and mapping of phonon and plasmon signals.
Specifications
- Category: Microscopy and Imaging
- Technique: TEM
- Manufacturer: JEOL
- Country: Japan
- Available: Active
Specifications
Atomic resolution analytical microscope with double Wien-filter monochromator. Achieves ultra-high energy resolution for EELS. Enables monochromatic STEM imaging and mapping of phonon and plasmon signals.
- Status: Active
- Country: Japan
- Analyte Type / Target Of Analysis: Morphology and microstructure
- Vibration / Magnetic / Noise Tolerance: Microscope room isolated from power, chiller, compressor
- Electron Gun Type: Schottky FEG
- STEM: Yes
- STEM Parameters: HAADF-STEM with 1 nm probe; STEM unaffected by monochromator slit size
- Additional Analytical Capabilities: Monochromatic EELS, phonon/vibrational spectroscopy, plasmon mapping
- Electron Optics: Double Wien-filter monochromator, Schottky source, post-accelerator design
- Resolution [EM]: 14 meV at 30 kV; 24–260 meV at 60/200 kV depending on slit width
- Optical Column: Double Wien-filter “Spot-IN and Spot-OUT system”
- Electron Beam Resolution: 14 meV energy resolution at 30 kV; 30 meV at 200 kV
- Beam Current: 75 pA for plasmon mapping; 10 pA for phonon EELS
- Aberration Correction Type: Achromatic and stigmatic exit beam after monochromator
- Environmental Specifications: Room isolation from pumps and power; low acoustic/vibration required
- Physical Specifications: Microscope room: 5000×5500×3300 mm; Utility: 5000×2200×2000 mm
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