JEM-2100Plus

Multi-purpose TEM, successor of JEM-2100, advanced control system, TEM Center UI, STEM integration

• Status: Active
• Country: Japan
• Analyte Type / Target Of Analysis: Morphology and microstructure
• Standard Detectors [EM]
  : JEOL bottom-mount camera (Ruby 8MP CCD or Matataki Flash sCMOS)
• STEM
  : Yes
• STEM Parameters: STEM-BF, STEM-DF, auto contrast, scan rotation
• Additional Analytical Capabilities
  : EDS with STEM, STEM tomography, SightX Viewer software
• Electron Optics
  : JEM-2100 optical system with advanced control and integration
• Resolution [EM]
  : Lattice: 0.14 nm; Point-to-point: 0.194–0.31 nm; STEM BF: 1.0 nm
• Electron Beam Resolution
  : STEM BF image (edge to edge): 1.0 nm
• Image Parameters
  : BF/DF TEM, STEM-BF/DF, Ronchigram, montage, drift correction
• Magnification
  : TEM: ×30 to ×8,000,000; STEM: ×100 to ×2,000,000
• Camera Details
  : JEOL Ruby 8MP CCD or Matataki Flash sCMOS
• Stage Parameters
  : Stage navigation, drift correction, fully integrated movement
• Cooling System
  : Flow rate 7.5 L/min, temperature 15–20 °C, pressure 0.2–0.3 MPa
• Power Specifications: 200 V AC, 10 kVA
• Environmental Specifications: Temperature 20 ±5 °C, fluctuation ≤1 °C/h, humidity ≤60%
• Physical Specifications: Floor space 2,800×3,000 mm, ceiling height ≥2,800 mm, entrance ≥800×1,900 mm