JEM-1400Flash

TEM with high-sensitivity sCMOS camera, Limitless Panorama imaging, and wide application support including STEM, EDS, and tomography

• Status: Active
• Country: Japan
• Analyte Type / Target Of Analysis: Morphology and microstructure
• Vibration / Magnetic / Noise Tolerance
  : Vibration ≤6.3 μm/s, magnetic field variation ≤0.1 μT, noise ≤60 dB
• Standard Detectors [EM]
  : JEOL sCMOS camera (Matataki Flash)
• Optional Detectors [EM]: STEM/EDS, Tomography, optional diffraction components
• Cryo
  : Optional
• STEM
  : Optional
• STEM Parameters: STEM-BF, STEM-DF, Image Acquisition Unit, SCOD and Image Acquisition Device required
• Additional Analytical Capabilities
  : STEM, EDS, Tomography, Picture Overlay, Asbestos analysis
• Electron Optics
  : Standard TEM column with optional STEM and tomography support
• Resolution [EM]
  : 0.2 nm (HC), 0.14 nm (HR)
• Electron Beam Resolution
  : STEM BF image (edge to edge): 2.0 nm (HC), 1.5 nm (HR)
• Image Parameters
  : Auto montage, auto exposure, auto focus, LLP, Picture Overlay, Cryo, STEM/EDS, tomography
• Magnification
  : TEM: ×200 to ×1,200,000, STEM: ×5,000 to ×2,000,000 (STD), ×10,000 to ×2,000,000 (HR)
• Camera Details
  : Matataki Flash sCMOS: 2048×2048, 30 fps, 16-bit TIFF/BMP/JPEG
• Stage Parameters
  : Tilt-X ±70° (High Tilting), ±25° (Standard), Tilt-Y ±9°
• Holder Types: Quick Change Holder, Quartet, High Tilting, Beryllium Retainer, Specimen Tilting, Cryo-compatible holders
• Cooling System
  : Flow rate 3–5 L/min, 1,600–2,500 W, 0.2–0.3 MPa
• Vacuum System
  : TMP or DP vacuum pump, cryo support optional
• Power Specifications: Single phase 200 V, 5 kVA (main), 8 kVA (with STEM), compressor: 1.0 kVA
• Environmental Specifications: 15–25 ℃, fluctuation ≤1 ℃/h, humidity ≤60%, vibration ≤6.3 μm/s, magnetic variation ≤0.1 μT, noise ≤60 dB
• Physical Specifications: Floor: 2,700×3,000 mm, height ≥2,600 mm, entrance ≥800×1,800 mm