Specifications

  • Category: Microscopy and Imaging
  • Technique: TEM
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
All specifications

About

Short description

Compact, easy-to-use TEM with NeoView camera and ECO mode; suited for biological applications and routine use

Specifications

Compact, easy-to-use TEM with NeoView camera and ECO mode; suited for biological applications and routine use

  • Status: Active
  • Country: Japan
  • Analyte Type / Target Of Analysis: Morphology and microstructure
  • Electron Gun Type
    : Thermionic source (W)
  • Standard Detectors [EM]
    : Multi-functional digital camera NeoView
  • Optional Detectors [EM]: JEOL SightSKY CMOS, LLP, CLEM, tomography
  • Cryo
    : Optional
  • STEM
    : Optional
  • STEM Parameters: Optional SCAN/STEM functions, single-crystal LaB6 recommended
  • Additional Analytical Capabilities
    : LLP, CLEM, Tomography (SIF), EDS (optional)
  • Electron Optics
    : Fully automated apertures, no magnification switching required
  • Resolution [EM]
    : 0.2 nm (HC), 0.14 nm (HR)
  • Image Parameters
    : NeoView camera, high frame rate, drift correction, LLP, CLEM
  • Magnification
    : ×50 to ×1,200,000 (HC), ×50 to ×1,500,000 (HR)
  • Camera Details
    : NeoView camera: 4M pixels, 30 fps, TIFF/BMP/JPEG
  • Stage Parameters
    : X/Y shift ±1 mm, Z ±0.3 mm, tilt-X ±35° (Quick), ±80° (High Tilting), tilt-Y ±18°/±30°
  • Holder Types: Quick Change Holder, Specimen Quartet, High Tilting, Common Holder, Beryllium Retainer
  • Cooling System
    : Flow rate 6 L/min, 1,600 W heat, 0.1–0.14 MPa
  • Vacuum System
    : Full dry evacuation system
  • Power Specifications: Single phase 200 V, 5 kVA
  • Environmental Specifications: 15–25 ℃, fluctuation ≤1 ℃/h, humidity ≤60%
  • Physical Specifications: Floor: 3,000×3,300 mm, height ≥2,200 mm, entrance ≥900×1,900 mm

Other company product

Loading other products...