Specifications

  • Category: Microscopy and Imaging
  • Technique: SEM
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
All specifications

About

Short description

Benchtop SEM with Live Analysis, Zeromag optical-SEM integration, 3D imaging, compact and user-friendly

Specifications

Benchtop SEM with Live Analysis, Zeromag optical-SEM integration, 3D imaging, compact and user-friendly

  • Status: Active
  • Country: Japan
  • Analyte Type / Target Of Analysis: Morphology and microstructure
  • Electron Gun Type
    : Thermionic source (W)
  • Standard Detectors [EM]
    : Secondary and backscattered electron detectors (composition, topographic, shadow, 3D images)
  • Optional Detectors [EM]: EDS, Particle Analysis Software 3, 3D Analysis Software, Stage Navigation, Tilting/Rotating holder
  • Cryo
    : Optional
  • Additional Analytical Capabilities
    : Live EDS, Live Map, Particle Analysis, 3D analysis, Asbestos check, elemental maps
  • Electron Optics
    : High and low vacuum modes, motor drive stage, optional stage navigation system
  • Image Parameters
    : SE and BE images, Live 3D, elemental map, backscattered topographic and compositional images
  • Magnification
    : ×10 to ×100,000; Display: ×24 to ×202,168
  • Chamber
    : Draw-out specimen chamber; 80 mm dia. × 50 mm height
  • Camera Details
    : 640×480 to 5120×3840; 24” LCD monitor
  • Stage Parameters
    : X-Y motor drive stage, X: 40 mm, Y: 40 mm
  • Holder Types: Tilting and rotating motor drive holder (optional)
  • Sample Size: Max 80 mm dia. × 50 mm height
  • Cooling System
    : No cooling water or LN2 required
  • Vacuum System
    : Fully automatic, TMP + RP
  • Power Specifications: 100/120/220/240 V AC, max 960 VA
  • Environmental Specifications: Humidity 30–60% RH, desk ≥100 kg, rigid
  • Physical Specifications: 324×586×566 mm, 67 kg

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