J-Series III

High-resolution SIMS instrument with low-damage ion sources, exceptional depth profiling, and modular adaptability for various applications.

• Status: Active
• Country: United Kingdom of Great Britain and Northern Ireland
• Isotopic: Yes
• Elemental: Yes
• Analyte Type / Target Of Analysis: Most of elements, isotopes, and molecular species
• Measurable Isotopes/Elements: Isotopes of light to heavy elements, molecular species like lipids and proteins
• Analyzer Type
  : Time-of-Flight MS
• Ion Source Type: Gas Cluster Ion Beam (GCIB), C60 Ion Beam, and ECR Plasma Ion Gun
• Inlet Types: Cryo-compatible sample handling with glovebox integration
• High Resolution
  : Yes
• Sensitivity
  : Superior sensitivity for low-abundance analytes with a 500x improvement for water sources
• Detection Limits
  : Sub-ppm levels for trace elements and organics
• Detector Type
  : Buncher ToF detector with tandem MS capability
• Primary Beam [SIMS]
  : GCIB (70 kV), C60, ECR Plasma (Xe, O2, He)
• Voltage
  : Up to 70 kV
• Spatial Resolution
  : Down to 1.5 μm
• Depth Profile
  : Sub-10 nm depth resolution
• Beam Energy
  : Up to 70 keV for GCIB
• Camera
  : High-resolution optical imaging for sample navigation
• Geometry Type
  : Tandem MS with buncher ToF
• Focusing Type
  : Electrostatic focusing
• Cooling System
  : Liquid nitrogen cooling for extended cryogenic workflows
• Vacuum System
  : Ultra-high vacuum system with cryo-compatible pumping
• Gas Supply: Argon, oxygen, xenon, helium