IONMASTER

High-resolution magnetic sector SIMS for nanoanalytics and ion microscopy.

• Status: Active
• Country: Germany
• Isotopic: Yes
• Elemental: Yes
• Analyte Type / Target Of Analysis: Most of elements, isotopes, and molecular species
• Measurable Isotopes/Elements: All detectable isotopes and elements
• Analyzer Type
  : Magnetic Sector MS
• Ion Source Type: Liquid Metal Alloy Ion Source (LMAIS)
• Inlet Types: Direct solid surface analysis
• High Resolution
  : Yes
• Sensitivity
  : < 10 ppm
• Dynamic Range
  : 10⁷
• Detector Type
  : Continuous focal plane detector
• Primary Beam [SIMS]
  : Multiple ion species (light/heavy/reactive) from LMAIS
• Voltage
  : 35 kV (e.g. Au⁺ primary beam)
• Spatial Resolution
  : < 20 nm SIMS imaging; ≤ 5 nm SE imaging
• Depth Profile
  : Yes (with 3D SIMS reconstruction and layer-by-layer milling)
• Beam Energy
  : Up to 35 kV
• Camera
  : Yes (SE imaging, beam tuning, CAD navigation)
• Geometry Type
  : Magnetic sector SIMS with MagSIMS optics
• Focusing Type
  : Optimized ion optics and laser interferometer-based positioning