Iliad 300

Integrated EELS & Dual-X or Super-X EDX; NanoPulser beam blanker; For advanced materials analysis

• Status: Active
• Country: United States of America
• Analyte Type / Target Of Analysis: Morphology and microstructure
• Electron Gun Type
  : Cold FEG
• Standard Detectors [EM]
  : Zebra EELS, Super-X or Dual-X EDX
• Optional Detectors [EM]: EBSD, EFTEM optional
• STEM
  : Yes
• STEM Parameters: Probe corrected; Multimodal EELS/EDX; up to 5 MultiEELS windows
• Additional Analytical Capabilities
  : EDX (Super-X / Dual-X), EELS (MultiEELS), AutoScript, Velox
• Electron Optics
  : Cold FEG (X-CFEG), integrated EELS spectrometer, NanoPulser beam blanker
• Resolution [EM]
  : 50 pm STEM resolution; 0.025 eV EELS resolution (UHR pkg)
• Optical Column
  : S-TWIN lens; chromatic defocus correction optics
• Electron Beam Resolution
  : STEM: 50 pm (probe corrected); Info limit: 70 pm (UHR)
• Beam Current
  : - (probe currents listed per resolution only)
• Image Parameters
  : EELS rate: up to 10,000 spectra/s
• Holder Types: Compatible with broad range of holders
• Aberration Correction Type
  : Probe corrected STEM (HR/UHR)