Specifications

  • Category: Microscopy and Imaging
  • Technique: TEM
  • Manufacturer: Hitachi High-Tech
  • Country: Japan
  • Available: Active
All specifications

About

Short description

TEM for biological and industrial materials. Wide field observation at low magnifications. High-contrast imaging of biological ultra-thin sections

Specifications

TEM for biological and industrial materials. Wide field observation at low magnifications. High-contrast imaging of biological ultra-thin sections

  • Status: Active
  • Country: Japan
  • Analyte Type / Target Of Analysis: Morphology and microstructure
  • Electron Gun Type
    : Thermionic source (LaB₆)
  • Standard Detectors [EM]
    : High-sensitivity CMOS camera (VELETA, Rio9, etc.)
  • Optional Detectors [EM]: EDX (EDAX, Bruker), CCD/CMOS cameras, STEM detector
  • Cryo
    : Optional
  • STEM
    : Optional
  • STEM Parameters: STEM detector optional
  • Additional Analytical Capabilities
    : EDX, STEM, tomography, low-dose imaging
  • Resolution [EM]
    : 0.38 nm (lattice image)
  • Electron Beam Resolution
    : 0.38 nm
  • Image Parameters
    : TEM, SE, STEM, EDX, wide field observation
  • Magnification
    : ×20 to ×600,000 (photo magnification), ×25 to ×800,000 (display)
  • Chamber
    : Specimen up to 3 mm dia. standard
  • Camera Details
    : CMOS camera options: Rio9, VELETA, TEMCAM, etc.
  • Stage Parameters
    : Motorized stage with 5-axis control
  • Holder Types: Single-tilt, double-tilt, high tilt, rotation, heating, cooling, cryo holders
  • Sample Size: 3 mm diameter (standard)
  • Cooling System
    : Optional cooling stage available
  • Vacuum System
    : Dry scroll and turbo pumps
  • Power Specifications: AC100 V ±10%, 1 kVA or less
  • Environmental Specifications: 20–25 °C, 50% RH or less
  • Physical Specifications: Main unit: 900×1300×1600 mm, approx. 650 kg

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