Specifications

  • Category: Microscopy and Imaging
  • Technique: SEM
  • Manufacturer: EOI
  • Country: United States of America
  • Available: Active
All specifications

About

Short description

Tabletop SEM with intuitive UI, fast vacuum cycle, and charge reduction imaging

Specifications

Tabletop SEM with intuitive UI, fast vacuum cycle, and charge reduction imaging

  • Status: Active
  • Country: United States of America
  • Analyte Type / Target Of Analysis: Morphology and microstructure
  • Electron Gun Type
    : Thermionic source (W)
  • Standard Detectors [EM]
    : SE Detector, 4CH BSE Detector
  • Optional Detectors [EM]: EDS, Auto Rotation, Auto Tilt, Chamber Camera, Navigation
  • STEM
    : Optional
  • Additional Analytical Capabilities
    : SEM-EDS integration, Auto Rotation, Auto Tilt
  • Electron Optics
    : Electromagnetic/electrostatic optics with SE and BSE; beam shift 100 μm
  • Resolution [EM]
    : 5.0 nm (SE image at 30 kV)
  • Electron Beam Resolution
    : 5.0 nm
  • Image Parameters
    : Focus, preview, slow, and photo modes; 3200×2400 max; auto brightness/focus/filament
  • Magnification
    : ×10 – ×200,000
  • Camera Details
    : Navigation camera; optional chamber camera
  • Stage Parameters
    : 5-axis: X/Y: 42 mm (motorized), Z: 5–53 mm, Tilt: ±90° (manual), Rotation: 360°
  • Sample Size: Horizontal: 140 mm, Vertical: 80 mm
  • Vacuum System
    : Turbo pump + rotary vane pump, auto valve system; vacuum ready in 90 sec
  • Power Specifications: 100 – 240 VAC, 50/60 Hz, 1 kVA
  • Environmental Specifications: 15 – 25 °C, 20–80% RH
  • Physical Specifications: 410 × 440 × 520 mm, 65 kg

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