Field emission cryo-electron microscope for single particle analysis, tomography, and MicroED. Includes new CFEG and Omega filter with improved stability. Enables automated screening, data acquisition, and long-term sample storage.
Specifications
- Category: Microscopy and Imaging
- Technique: TEM
- Manufacturer: JEOL
- Country: Japan
- Available: Active
Specifications
Field emission cryo-electron microscope for single particle analysis, tomography, and MicroED. Includes new CFEG and Omega filter with improved stability. Enables automated screening, data acquisition, and long-term sample storage.
- Status: Active
- Country: Japan
- Analyte Type / Target Of Analysis: Morphology and microstructure
- Electron Gun Type: Cold FEG
- Optional Detectors [EM]: BF-STEM, DF-STEM, Hole-free phase plate
- Cryo: Yes
- STEM: Optional
- STEM Parameters: BF-STEM, DF-STEM detectors
- Additional Analytical Capabilities: Energy-filtered imaging, EELS, TEMography, MicroED, JADAS automation
- Electron Optics: Cold FEG with <0.35 eV energy spread; in-column Omega filter
- Resolution [EM]: <0.35 eV energy spread; application resolution: 1.98 Å (GroEL), 2.5 Å (Photosystem I), 2.1 Å (Catalase diffraction)
- Optical Column: In-column Omega energy filter
- Beam Current: Stabilized probe current for 8 hrs; fluctuation <10%
- Chamber: Air-lock cryo-transfer system; specimen exchange and storage built-in
- Camera Details: Direct detection camera
- Stage Parameters: Motor drive X/Y (±1 mm), Z (±0.2 mm); Tilt-X ±70°; Rotation 0° or 90°
- Holder Types: Specimen cartridge for 4; parking stage for 12
- Cooling System: Liquid nitrogen, automated filling system
- Power Specifications: 3-phase, 200 V AC, 12 kVA
- Environmental Specifications: Temp: 15–25°C (±1°C/h); RH ≤60%; pressure fluctuation ≤30 Pa; noise ≤60 dB
- Physical Specifications: Microscope Room: 6000×5500 mm; Ceiling: 3850 mm
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