Specifications

  • Category: Microscopy and Imaging
  • Technique: SEM
  • Manufacturer: Seron
  • Country: Korea (Republic of)
  • Available: Active
All specifications

About

Short description

Advanced compact SEM. Designed to minimize EMI and vibration. 2-stage lens system.

Specifications

Advanced compact SEM. Designed to minimize EMI and vibration. 2-stage lens system.

  • Status: Active
  • Country: Korea (Republic of)
  • Analyte Type / Target Of Analysis: Morphology and microstructure
  • Vibration / Magnetic / Noise Tolerance
    : 3μm/sec @ 5–10Hz; EMI compliant
  • Electron Gun Type
    : Thermionic source (W)
  • Standard Detectors [EM]
    : SE
  • Additional Analytical Capabilities
    : AOI Tool
  • Electron Optics
    : 2-Stage Lens (CL & OL)
  • Resolution [EM]
    : < 7nm @ 20KeV
  • Image Parameters
    : Area Mode(640x480), Photo(3840x2880)
  • Magnification
    : 100,000X + Digital Zoom 2X, 4X
  • Stage Parameters
    : X,Y(40mm) / Z(530mm) / Rotation(360°) / Tilt(045°)
  • Aberration Correction Type
    : Aberration reduction optic design
  • Power Specifications: 220–230V AC, 5KW, 50/60Hz
  • Environmental Specifications: 22±2°C, Humidity < 70%
  • Physical Specifications: 360(W) × 440(D) × 580(H) mm

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