Specifications

  • Category: Microscopy and Imaging
  • Technique: SEM
  • Manufacturer: Angstrom Advanced
  • Country: United States of America
  • Available: Active
All specifications

About

Short description

Multi-purpose SEM. Fully automated, high-performance, compact design. Fast scan speed, pixel resolution, and noise-free image acquisition.

Specifications

Multi-purpose SEM. Fully automated, high-performance, compact design. Fast scan speed, pixel resolution, and noise-free image acquisition.

  • Status: Active
  • Country: United States of America
  • Analyte Type / Target Of Analysis: Morphology and microstructure
  • Electron Gun Type
    : Thermionic source (W)
  • Standard Detectors [EM]
    : Bar Type SE Detector (SE-BSE conversion mode without BSE detector)
  • Optional Detectors [EM]: BSE, EDS, WDS, EBSD, CCD, manipulator
  • Additional Analytical Capabilities
    : EDS, WDS, EBSD, 3D data view, particle counter, Excel data export
  • Electron Optics
    : Dual field objective lens for spherical aberration reduction; upgraded magnetic lens (CL/OL)
  • Resolution [EM]
    : 3.0 nm @ 30 kV SE / 4.0 nm @ BSE
  • Optical Column
    : Electromagnetic condenser (2 stages), objective (1 stage), 8-pole stigmator
  • Electron Beam Resolution
    : 3.0 nm / 4.0 nm
  • Image Parameters
    : Search (640×480) >30 fps, Inspection (1280×960) 30 fps, Photo (4096×4096) 2 fps
  • Magnification
    : 10 – 1,000,000X
  • Chamber
    : 50 × 60 × 57 mm, supports multiple detectors
  • Stage Parameters
    : X/Y/Z = 60/70/65 mm, Tilt: –20° to +60° (Max 90°), Rotation = 360°, Motorized X,Y,R (standard); full motorization optional
  • Aberration Correction Type
    : Dual field objective lens, upgraded lens design for spherical aberration reduction
  • Vacuum System
    : Rotary Pump + Diffusion or Turbo Pump; Full automation with safety system

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