Specifications

  • Category: Microscopy and Imaging
  • Technique: SEM
  • Manufacturer: Angstrom Advanced
  • Country: United States of America
  • Available: Active
All specifications

About

Short description

Multi-user SEM. High performance in all SEM modes & particle counter. Combines versatility and flexibility with ease of use.

Specifications

Multi-user SEM. High performance in all SEM modes & particle counter. Combines versatility and flexibility with ease of use.

  • Status: Active
  • Country: United States of America
  • Analyte Type / Target Of Analysis: Morphology and microstructure
  • Vibration / Magnetic / Noise Tolerance
    : Air-cylinder anti-vibrator included
  • Electron Gun Type
    : Thermionic source (W)
  • Standard Detectors [EM]
    : High Sensitivity SE Detector
  • Optional Detectors [EM]: EDX, WDX, etc.
  • Additional Analytical Capabilities
    : Particle counter (Blob Analysis), measurement tools, filters, AOI, tiling
  • Resolution [EM]
    : 3 nm @ 30 kV SE
  • Electron Beam Resolution
    : 3 nm
  • Beam Current
    : 1 pA – 8 µA
  • Image Parameters
    : Area (640×480), Inspection (up to 2048×1536), Photo (2048×1536 to 8192×6144)
  • Magnification
    : 10X – 300,000X, Digital Zoom ×2/×4/×8
  • Chamber
    : Dia 810 × 190 (H) mm, ports for SE, BSE, EDS, CCD
  • Camera Details
    : 22” LCD display
  • Stage Parameters
    : 5-axis: X/Y/Z = 40 mm, Tilt: 0–60°, Rotation = 360°; motorization optional
  • Vacuum System
    : Rotary + Turbo Pump; Full automation/manual mode; Pirani + Penning Gauge
  • Environmental Specifications: Air or gas (e.g., N₂) supply required for anti-vibration system

Other company product

Loading other products...