Specifications

  • Category: Microscopy and Imaging
  • Technique: SEM
  • Manufacturer: Angstrom Advanced
  • Country: United States of America
  • Available: Active
All specifications

About

Short description

Desktop multi-purpose SEM. High performance in all SEM modes & particle counting. Easy operation in a multi-user environment.

Specifications

Desktop multi-purpose SEM. High performance in all SEM modes & particle counting. Easy operation in a multi-user environment.

  • Status: Active
  • Country: United States of America
  • Analyte Type / Target Of Analysis: Morphology and microstructure
  • Electron Gun Type
    : Thermionic source (W)
  • Standard Detectors [EM]
    : High Sensitivity SE Detector
  • Optional Detectors [EM]: EDS, BSE, etc.
  • Additional Analytical Capabilities
    : Particle counter (Blob Analysis), measurement tools, filters, AOI, tiling
  • Resolution [EM]
    : 5 nm @ 30 kV SE
  • Electron Beam Resolution
    : 5 nm
  • Beam Current
    : 1 pA – 8 µA
  • Image Parameters
    : Area (320×240), Inspection (640×480), Photo (1280×960 to 5120×3840, option up to 8192×6144)
  • Magnification
    : 10X – 150,000X (optional 200,000X), Digital Zoom ×2/×4/×8
  • Camera Details
    : 22” LCD display
  • Stage Parameters
    : 5-axis: X/Y/Z = 40 mm, Rotation = 360°; Tilt 0–90° optional; stage motorization optional
  • Vacuum System
    : Rotary + Turbo Pump; Full automation/manual mode; Pirani + Penning Gauge

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